Internal Nano Voids in Yttria-Stabilised Zirconia (YSZ) Powder
نویسندگان
چکیده
منابع مشابه
Internal Nano Voids in Yttria-Stabilised Zirconia (YSZ) Powder
Porous yttria-stabilised zirconia ceramics have been gaining popularity throughout the years in various fields, such as energy, environment, medicine, etc. Although yttria-stabilised zirconia is a well-studied material, voided yttria-stabilised zirconia powder particles have not been demonstrated yet, and might play an important role in future technology developments. A sol-gel synthesis accomp...
متن کاملYttria stabilised zirconia ( YSZ ) membranes and their applications By Chiao - Chien
Ceramic hollow-fibre membranes which have an asymmetric structure have been prepared in one step, using an immersion induced phase inversion technique. With this method, membranes with a high surface area per unit volume ratio can be produced, while production cost is dramatically reduced. Yttria-stabilised zirconia (YSZ) is selected as a membrane material, as it is relatively inexpensive and h...
متن کاملOxygen Transport and Association in Yttria Stabilised Zirconia
1. Introduction 1. Introduction Zirconia is widely used due to its high oxygen diffusivity in various technological applications like gas sensors, fuel cells, catalytic membranes etc. The material shows an excellent thermal stability, combined with very good mechanical properties.
متن کاملModifications of Yttria Fully Stabilised Zirconia Thin Films by Ion Irradiation in the Inelastic Collision Regime
Radiation tolerance of Yttria Fully Stabilised Zirconia (FSZ) [1-3] to ion beams in the elastic collision regime has been investigated with respect to material structure, microstructure, and nature and distribution of defects. FSZ cannot be amorphised by exposure to heavy ions [4] and shows excellent thermal stability, making it particularly attractive as inert matrix for nuclear fuel elements ...
متن کامل18O-tracer diffusion along nanoscaled Sc2O3/yttria stabilized zirconia (YSZ) multilayers: on the influence of strain
The oxygen tracer diffusion coefficient describing transport along nano-/microscaled YSZ/Sc2O3 multilayers as a function of the thick-ness of the ion-conducting YSZ layers has been measured by isotope exchange depth profiling (IEDP), using secondary ion mass spec-trometry (SIMS). The multilayer samples were prepared by pulsed laser deposition (PLD) on (0001) Al2O3 single crystalline substrates....
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ژورنال
عنوان ژورنال: Materials
سال: 2017
ISSN: 1996-1944
DOI: 10.3390/ma10121440